The <MM1897> features a built-in latch-up release function (patent pending) with (1) Latch-up detection ⇒ (2) Power source shut-off ⇒ (3) Latch-up release ⇒ (4) Automatic recovery sequence, which helps to prevent damage to micro-computers caused by latch-up.
The use of bi-polar processing and a noise suppression element result in a design that makes it difficult for the IC itself to cause damage due to latch-up or static electricity.
Results of static electricity noise/electric field noise/magnetic field noise tests that comply with IEC61000-4-2 (Electrostatic Discharge Immunity Tests) have show a much better ability to withstand noise than Mitsumi's previous products.

• Latch-up Release Function (current detection threshold, detection delay time and recovery delay time can be set)
• Resilient against noise (IEC61000 Contact Discharge Test immunity 25kV)
• Wide operating voltage range (maximum operating voltage 14V)

Power supply voltage	VOUT (Typ.) +0.5 to 14V (absolute maximum rating : -0.3V to 15V)
Operating temperature range	-30~+85℃
Consumption current	3mA typ.
Consumption current when OFF	10µA max.
Output voltage	A rank 5.0V typ. ±2%
	B rank 3.3V typ. ±2%
Input/output voltage difference	0.1V typ. (VCC-0.2V, IOUT=50mA)
Abnormal current detection current *1	100mA typ. (RLATCH=2kΩ)
Abnormal current detection delay time *2	1.0ms typ. (CD=0.1µF)
Output recovery time *3	10ms typ. (CR=0.1µF)
Package	DIP-8, DIP-16, SOP-16
*1 Can be set with external resistance RLATCH *2 Can be set with external capacity CD *3 Can be set with external capacity CR * Specifications may change due to modifications or improvements